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AECQ 200 MLCC Stress test requirements table
Oct 07, 2018

Test item

Standard

Sample quantity

Annotation

1

post-stress electrical testing

User specification

All samples

G

2

high-temperature storage

MIL-STD-202 Method 108

77x1=77

DG

3

temperature cycle

JESD22 Method JA-104

77x1=77

DG

4

destructive physical analysis

EIA-469

10x1=10

DG

5

partial wet

MIL-STD-202 Method 103

77x1=77

DG

6

life

MIL-STD-202 Method 108

77x1=77

DG

7

external visual inspection

MIL-STD-883 Method 2009

All samples

NG

8

Physical size

JESD22 Method JB-100

30x1=30

NG

9

resistance to dissolve

MIL-STD-202 Method 215

5x1=5

DG

10

mechanical shock

MIL-STD-202 Method 213

30x1=30

DG

11

vibration

MIL-STD-202 Method 204

30x1=30

DG

12

welding thermal resistance

MIL-STD-202 Method 210

30x1=30

DG

13

ESD

AEC-Q200-002 or ISO/DIS10605

15x1=15

D

14

solderability

J-STD-002

15pcs

D

15

electrical characteristics

User specification

30x3=90

NG

16

plate bending

AEC-Q200-005

30x1=30

DS

17

lead strength

AEC-Q200-006

30x1=30

DS

18

beam load test

AEC-Q200-003

30x1=30

DG




total  668pcs


D Destructive test, after test device can not be used for other test or production supply

G Common data is available

N Non-destructive test, after test device can be used for subsequent test or production supply

S Requirements for surface mount devices